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vertrieb [at] gwp [dot] eu
vertrieb [at] gwp [dot] eu
Dr. Johannes Diller
Our microscopes:
Scanning electron microscopy (SEM) is a powerful technique for studying the surface structure and morphology of materials at a microscopic level. This high-resolution imaging technique uses electron beams to create a detailed image of an object's surface. Compared to conventional light microscopes, SEM offers significantly higher resolution and allows structures to be viewed in the nanometer range.
Our metallography has 2 modern scanning electron microscopes equipped with different detectors to cover a wide range of applications.
Surface structure of a plasma-induced focal spot
Microscopic fracture characteristics of a fatigue fracture
NaCl corroded steel surface
Fracture surface: thermoplastic elastomer after tensile test
Scanning electron microscopy of a molten wire (filament)
Deep-etched AlSi alloy with optimized microstructure
EDX Mapping: Liquid Metal Induced Conformal Boundary Damage in Cast Iron
REM image with EDX mapping
Element distribution image: EDX mapping analysis
When the electron beam interacts with the sample material, characteristic X-rays are generated, which can be used to determine the chemical composition qualitatively and semi-quantitatively. Point and integral analyses are mainly used to determine the chemical composition.
By scanning the sample with the electron beam, line scans can be created. For example, to analyze layer structures.
By scanning the sample with an electron beam and simultaneously measuring EDX, element distribution images can be created. The mappings are particularly interesting because they clearly show the differences in composition in relation to the structure.
